Crystallization kinetics and dielectric properties of fresnoite BaO-TiO2-SiO2 glass-ceramics

Journal of the American Ceramic Society

Volumn 92, Issue 11, 2009, Pages 2642-2647

  Rangarajan, Badri ^a   Shrout, Tom ^a   Lanagan, Michael ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY OF CRYSTALLIZATION; AVRAMI PARAMETER; DIELECTRIC APPLICATION; DIELECTRIC CONTRASTS; FRESNOITES; TIO; XRD; XRD ANALYSIS;

ACTIVATION ENERGY; BARIUM; DIELECTRIC PROPERTIES; GLASS CERAMICS; SILICON COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLIZATION KINETICS;

EID: 70350518321     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.03255.x     Document Type: Article

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