Preparation and characterization of BaO-TeO2 thin films obtained from tellurium(VI) alkoxide by a sol-gel method

Journal of the American Ceramic Society

Volumn 92, Issue 11, 2009, Pages 2619-2622

  Ikeda, Hiroshi ^a   Fujino, Shigeru ^a   Kajiwara, Toshihisa ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALKOXIDES; CRYSTALLIZATION TEMPERATURE; DIELECTRIC CONSTANTS; FOURIER TRANSFORM INFRARED SPECTROMETRY; MELT-QUENCH METHOD; OPTICAL TRANSMITTANCE; SOL-GEL METHODS; STRUCTURAL UNIT; TRANSMISSION SPECTRUMS; X RAY DIFFRACTOMETRY;

CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GELATION; GELS; LIGHT REFRACTION; LIGHT TRANSMISSION; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PERMITTIVITY; REFRACTIVE INDEX; REFRACTOMETERS; SOL-GEL PROCESS; SOL-GELS; SOLS; TELLURIUM; TELLURIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FILM PREPARATION;

EID: 70350508551     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.03280.x     Document Type: Article

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