Application of terrestrial laser scanning methodology in geometric tolerances analysis of tunnel structures

Tunnelling and Underground Space Technology

Volumn 21, Issue 3-4, 2006, Pages 410-

  Lam, Steve Y W ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

FITS AND TOLERANCES; GEOMETRY; LASER APPLICATIONS; SCANNING; SURVEYS;

CALIBRATION METHOD; COMPUTATIONAL ALGORITHM; DISPLACEMENT VECTORS; GEOMETRIC TOLERANCE; MULTI-MODALITY; TERRESTRIAL LASER SCANNERS; TERRESTRIAL LASER SCANNING; TUNNEL STRUCTURES;

STRUCTURES (BUILT OBJECTS);

EID: 70350466354     PISSN: 08867798     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tust.2005.12.057     Document Type: Conference Paper

References (14)

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4. British Tunnelling Society of Institution of Civil Engineers, 1997. Model Specification for Tunnelling, London: Thomas Telford.
5. Chrzanowski, A., 1981. "Optimisation of breakthrough accuracy in tunnelling surveys," Canadian Surveyor, Vol.35, pp. 5-16.
6. ISO 1101, 1983. Geometrical Tolerances. Geneva: International Organization for Standardization.
7. ISO 9001, 2000. Quality Management Systems - Requirements. Geneva: International Organization for Standardization.
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11. Matabosch, C., Salvi, J., Pinsach, X. and Garcia, R., 2004. "Surface Registration from Range Image Fusion," Proceedings, pp. 678-683, IEEE International Conference on Robotics and Automation, New Orleans, USA.
12. Rietdorf, A., Gielsdorf, F. and Gruendig, L., 2004. "A Concept for the Calibration of Terrestrial Laser Scanners," Proceedings, INGEO 2004 and FIG Regional Central and Eastern European Conference on Engineering Surveying, Slovakia, November 11-13, 2004.
13. Rodrigues, M. and Liu, Y., 2002. "On the Representation of Rigid Body Transformations for Accurate Registration of Free-form Shapes," Robotics and Autonomous Systems, Vol.39, pp. 37-52.
14. Sagawa, R., Nishino, K. and Ikeuchi, K., 2005. "Adaptively merging Larger-Scale Range Data with Reflectance Properties," IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol.27, No.3, pp. 392-405.