Molecular structure determination from x-ray scattering patterns of laser-aligned symmetric-top molecules

Journal of Chemical Physics

Volumn 131, Issue 13, 2009, Pages

  Ho, P J ^a   Starodub, D ^b   Saldin, D K ^c   Shneerson, V L ^c   Ourmazd, A ^c   Santra, R ^a,d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^d UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC NUMBERS; INTENSE LASER PULSE; MOLECULAR ELECTRON DENSITY; PHASE RETRIEVAL; ROTATIONAL TEMPERATURE; SCALE RESOLUTION; STRUCTURAL RECONSTRUCTION; X-RAY PHOTON ENERGY;

ATOMS; DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; HOLOGRAPHIC INTERFEROMETRY; MOLECULAR STRUCTURE; PULSED LASER APPLICATIONS; RECONSTRUCTION (STRUCTURAL);

X RAY DIFFRACTION ANALYSIS;

EID: 70350446822     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3245404     Document Type: Article

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