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Volumn 14, Issue 11, 2009, Pages 581-586

Interdependence between measurement uncertainty and metrological traceability

Author keywords

Calibration; Measurement uncertainty; Metrological traceability

Indexed keywords


EID: 70350350028     PISSN: 09491775     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00769-009-0500-4     Document Type: Article
Times cited : (12)

References (13)
  • 1
    • 70350419106 scopus 로고    scopus 로고
    • BIPM IEC, IFCC, ILAC, ISO, IUPAC, IUPAP and OIML, International vocabulary of metrology-basic and general concepts and associated terms (VIM), JCGM 200:2008
    • BIPM IEC, IFCC, ILAC, ISO, IUPAC, IUPAP and OIML, International vocabulary of metrology-basic and general concepts and associated terms (VIM), JCGM 200:2008. http://www.bipm.org/utils/common/documents/jcgm/JCGM_200_2008.pdf.
  • 2
    • 31644433079 scopus 로고    scopus 로고
    • Measurement uncertainty and traceability
    • doi:10.1088/0957-0233/17/3/S13
    • Cox MG, Harris PM (2006) Measurement uncertainty and traceability. Meas Sci Technol 17:533-540. doi:10.1088/0957-0233/17/3/S13.
    • (2006) Meas Sci Technol , vol.17 , pp. 533-540
    • Cox, M.G.1    Harris, P.M.2
  • 3
    • 84866449168 scopus 로고    scopus 로고
    • BIPM IEC, IFCC, ILAC, ISO, IUPAC, IUPAP and OIML, Guide to the expression of uncertainty in measurement, JCGM 100:2008
    • BIPM IEC, IFCC, ILAC, ISO, IUPAC, IUPAP and OIML, Guide to the expression of uncertainty in measurement, JCGM 100:2008, GUM 1995 with minor corrections. http://www.bipm.org/utils/common/documents/jcgm/JCGM_100_2008_E.pdf.
    • GUM 1995 with Minor Corrections
  • 10
    • 70350403499 scopus 로고    scopus 로고
    • On the in-use uncertainty of an instrument
    • World Scientific, Singapore
    • Bich W, Pennecchi F (2004) On the in-use uncertainty of an instrument. In: Ciarlini P, Cox MG, Filipe E, Pavese F, Richter D (eds) Advanced mathematical & computational tools in metrology, VI. World Scientific, Singapore, pp 159-169.
    • (2004) Advanced Mathematical & Computational Tools in Metrology , vol.VI , pp. 159-169
    • Bich, W.1    Pennecchi, F.2
  • 11
    • 23744468105 scopus 로고    scopus 로고
    • Uncertainty evaluation. Tech. Rep. DEM-ES-011, National Physical Laboratory, Teddington, UK
    • Cox MG, Harris PM (2006) SSfM Best Practice Guide No. 6, Uncertainty evaluation. Tech. Rep. DEM-ES-011, National Physical Laboratory, Teddington, UK.
    • (2006) SSfM Best Practice Guide No. 6
    • Cox, M.G.1    Harris, P.M.2
  • 13
    • 84871336071 scopus 로고    scopus 로고
    • Bureau International des Poids et Mesures. In:, Appendix C
    • Bureau International des Poids et Mesures. In: The BIPM key comparison database, Appendix C. http://kcdb.bipm.org/AppendixC/default.asp.
    • The BIPM Key Comparison Database


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.