Characterization of continuous-wave terahertz sources: Laser mixing versus backward-wave oscillators

Applied Optics

Volumn 48, Issue 29, 2009, Pages 5490-5496

  Martens, Stephan ^a   Gompf, Bruno ^a   Dressel, Martin ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; INFRARED DEVICES; INFRARED LASERS; MICROWAVE OSCILLATORS; MIXING; TERAHERTZ SPECTROSCOPY;

ANGULAR CHARACTERISTICS; BACKWARD WAVE OSCILLATOR; CONTINUOUS WAVE TERAHERTZ RADIATIONS; CONTINUOUS-WAVE TERAHERTZ SOURCES; DEGREE OF LINEAR POLARIZATION; MONOCHROMATIC BEAM; NEAR-INFRARED LASERS; THZ SPECTROSCOPY;

TERAHERTZ WAVES;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LASER; OPTICAL INSTRUMENTATION; OSCILLOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TERAHERTZ RADIATION; TERAHERTZ SPECTROSCOPY;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LASERS; OPTICAL DEVICES; OSCILLOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TERAHERTZ RADIATION; TERAHERTZ SPECTROSCOPY;

EID: 70350322782     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.005490     Document Type: Article

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