A combination of a Drickamer anvil apparatus and monochromatic X-rays for stress and strain measurements under high pressure

Journal of Synchrotron Radiation

Volumn 16, Issue 6, 2009, Pages 742-747

  Nishiyama, Norimasa ^a   Wang, Yanbin ^b   Irifune, Tetsuo ^a   Sanehira, Takeshi ^b   Rivers, Mark L ^b   Sutton, Steve R ^b   Cookson, David ^b  

^a EHIME UNIVERSITY   (Japan)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

Deformation; Differential stress; Drickamer apparatus; High pressure; Strain

Indexed keywords

ADVANCED PHOTON SOURCE; AXIAL STRAIN; CRYSTALLINE MINERALS; DEFORMATION STUDIES; DIFFERENTIAL STRESS; DRICKAMER APPARATUS; EXPERIMENTAL SETUP; HIGH ENERGY PHOTONS; HIGH PRESSURE; HIGH TEMPERATURE; HIGH-PRESSURE X-RAY DIFFRACTIONS; MONOCHROMATIC SYNCHROTRON RADIATION; MONOCHROMATIC X-RAYS; POLYCRYSTALLINE PLATINUM; RINGWOODITE; ROOM TEMPERATURE; SINTERED DIAMOND; STRESS AND STRAIN;

DEFORMATION; DIFFRACTION; ELASTICITY; HYDROSTATIC PRESSURE; LIGHT; MINERALS; MONOCHROMATORS; PHOTONS; PLATINUM; SILICATE MINERALS; SILICON COMPOUNDS; STRAIN; STRUCTURAL DESIGN; TOOLS; TUNGSTEN; TUNGSTEN CARBIDE; X RAY APPARATUS;

X RAY RADIOGRAPHY;

EID: 70350306378     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509033342     Document Type: Conference Paper

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