Structural, microchemical and superconducting properties of ultrathin NbN films on silicon

Crystal Research and Technology

Volumn 44, Issue 10, 2009, Pages 1115-1121

  Schneider, R ^a   Freitag, B ^b   Gerthsen, D ^a   Ilin, K S ^a   Siegel, M ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b Thermo Fisher Scientific   (United States)

Author keywords

Hot electron bolometers; Microstructure; Transmission electron microscopy; Ultrathin NbN films

Indexed keywords

CRITICAL TEMPERATURES; FILM MORPHOLOGY; HOT ELECTRON BOLOMETER; HOT-ELECTRON BOLOMETERS; SCANNING TEM; SI SUBSTRATES; SUPERCONDUCTING PROPERTIES; TEM; ULTRA-THIN; ULTRATHIN NBN FILMS; ZERO RESISTANCE;

BOLOMETERS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; ELECTRONS; ENERGY DISSIPATION; INFRARED DETECTORS; MICROSTRUCTURE; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; ULTRATHIN FILMS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 70350304846     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200900462     Document Type: Article

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