Ultrashort pulse characterization by spectral shearing interferometry with spatially chirped ancillae

Optics Express

Volumn 17, Issue 21, 2009, Pages 18983-18994

  Witting, Tobias ^a   Austin, Dane R ^a   Walmsley, Ian A ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC FIELDS; ULTRAFAST PHENOMENA;

CALIBRATION METHOD; CALIBRATION PARAMETERS; CONSISTENCY CHECKING; SIMULTANEOUS ACQUISITION; SPECTRAL AMPLITUDE; SPECTRAL PHASE INTERFEROMETRY FOR DIRECT ELECTRIC FIELD; SPECTRAL SHEARING INTERFEROMETRY; ULTRASHORT PULSE CHARACTERIZATION;

INTERFEROMETRY;

EID: 70350290497     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.018983     Document Type: Article

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