SCOPUS 정보 검색 플랫폼

Journal of Synchrotron Radiation

Volumn 16, Issue 6, 2009, Pages 788-795

Use of a hexapod in diffraction measurements of substrate-supported crystals of organic semiconductors

(2) Yang, Lin a Yang, Hoichang b

a BROOKHAVEN NATIONAL LABORATORY (United States)

b Inha University (South Korea)

Author keywords

Grazing incidence; Hexapod; Transmission; X ray diffraction

Indexed keywords

COMPLEX SAMPLES; CRYSTAL PLANES; DIFFRACTION MEASUREMENTS; GRAZING INCIDENCE; HEXAPOD; IN-PLANE; IN-PLANE COMPONENTS; IN-PLANE ORIENTATION; INCIDENT ANGLES; LATTICE PARAMETERS; ORGANIC SEMICONDUCTOR; PENTACENES; ROTATION CENTERS; SAMPLE ROTATION; SCATTERING VECTORS; TIPS-PENTACENE; TRANSMISSION GEOMETRIES; X RAY BEAM;

CRYSTALS; DIFFRACTION; ROTATION; SEMICONDUCTING ORGANIC COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION;

CRYSTAL ORIENTATION;

EID: 70350278736 PISSN: 09090495 EISSN: 16005775 Source Type: Journal
DOI: 10.1107/S0909049509037911 Document Type: Conference Paper

Times cited : (5)

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