Free-form microlens for illumination applications

Applied Optics

Volumn 48, Issue 29, 2009, Pages 5520-5527

  Sun, Liwei ^a   Jin, Shangzhong ^a   Cen, Songyuan ^a  

^a CHINA JILIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPETITION; MICROLENSES; RAY TRACING;

B-SPLINE FITTINGS; COMPETITIVE ADVANTAGE; HIGH UNIFORMITY; RAY-TRACING METHOD; SECONDARY OPTICS; SURFACE SHAPE; TARGET SURFACE; UNIFORM ILLUMINATION;

LIGHT EMITTING DIODES;

EID: 70350277806     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.005520     Document Type: Article

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