SCOPUS 정보 검색 플랫폼

Volumn 2, Issue 10, 2009, Pages

Quick response of all solid electrochromic device

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE THICKNESS; ELECTRIC DOUBLE LAYER; ELECTRIC PRESSURE; QUICK RESPONSE;

CYANIDES; ELECTROCHROMIC DEVICES; ELECTROOPTICAL DEVICES;

ELECTROCHROMISM;

EID: 70350148775 PISSN: 18820778 EISSN: 18820786 Source Type: Journal
DOI: 10.1143/APEX.2.105502 Document Type: Article

Times cited : (13)

References (12)

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- We investigated the magnitude of q against dD and found that q increase from 0.08 e/Ni at dD = 880nm to 0.13 e/Ni at dD = 1230 nm. This indicates subsequent removal (addition) of the electrons from (into) the EDL region. Actually, the magnitude of q (= 0:13 e/Ni) is much larger than the value (= 0:03 e/Ni) estimated on the condition that the oxidization process is restricted in the ELD region
- We investigated the magnitude of q against dD and found that q increase from 0.08 e/Ni at dD = 880nm to 0.13 e/Ni at dD = 1230 nm. This indicates subsequent removal (addition) of the electrons from (into) the EDL region. Actually, the magnitude of q (= 0:13 e/Ni) is much larger than the value (= 0:03 e/Ni) estimated on the condition that the oxidization process is restricted in the ELD region.

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- Before making a device, the .lms were dipped in an aqueous solution containing 1 mol/LK+ and completely dried in air
- Before making a device, the .lms were dipped in an aqueous solution containing 1 mol/LK+ and completely dried in air.

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