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Volumn 486, Issue 1-2, 2009, Pages 480-485
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Microstructural characterization of nanocrystalline SiC synthesized by high-energy ball-milling
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Author keywords
Ball milling; HRTEM; Microstructural characterization; Nanocrystalline SiC; Rietveld's analysis; XRD
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Indexed keywords
HRTEM;
MICROSTRUCTURAL CHARACTERIZATION;
NANOCRYSTALLINE SIC;
RIETVELD'S ANALYSIS;
XRD;
AMORPHOUS SILICON;
ATMOSPHERIC TEMPERATURE;
GRAPHITE;
MECHANICAL ALLOYING;
METAL MELTING;
MILLING (MACHINING);
NANOCRYSTALLINE POWDERS;
POWDER METALS;
REACTION KINETICS;
RIETVELD ANALYSIS;
RIETVELD REFINEMENT;
SILICON;
SILICON CARBIDE;
SMELTING;
SPHERES;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
BALL MILLING;
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EID: 70350089404
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.06.170 Document Type: Article |
Times cited : (41)
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References (32)
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