A set-based mapping strategy for flash-memory reliability enhancement

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2009, Pages 405-410

  Chu, Yuan Sheng ^a   Hsieh, Jen Wei ^b   Chang, Yuan Hao ^c   Kuo, Tei Wei ^c  

^a MEDIATEK INC   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION DOMAINS; CONFIGURABLE; CRITICAL ISSUES; FLASH MEMORY CHIP; MAPPING STRATEGY; READ PERFORMANCE; RESOURCE REQUIREMENTS; STRONG DEMAND;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

FLASH MEMORY;

EID: 70350057480     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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