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Volumn 206, Issue 10, 2009, Pages 2257-2272

Identification and carrier dynamics of the dominant lifetime limiting defect in n - 4H-SiC epitaxial layers

Author keywords

[No Author keywords available]

Indexed keywords

A-CARBON; CAPTURE CROSS SECTIONS; CARRIER DYNAMICS; COMPLEX NATURE; DLTS; HIGH-POWER; INJECTION LEVELS; LIFE-TIMES; LOCAL ATOMIC STRUCTURES; MINORITY CARRIER; OPTICAL STUDY; SOLID-STATE SWITCHING; SPECTRAL SIGNATURE; TEMPERATURE DEPENDENCE;

EID: 70350020450     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200925155     Document Type: Article
Times cited : (29)

References (73)
  • 9
    • 70350024715 scopus 로고
    • Ph.D. thesis, Erlangen
    • H. Zhang, Ph.D. thesis, Erlangen (1990).
    • (1990)
    • Zhang, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.