Porosity dependence of elastic moduli in LAST (Lead-antimony-silver-tellurium) thermoelectric materials

Materials Chemistry and Physics

Volumn 118, Issue 2-3, 2009, Pages 459-466

  Ni, Jennifer E ^a   Ren, Fei ^a   Case, Eldon D ^a   Timm, Edward J ^a  

^a Michigan State University   (United States)

Author keywords

Elastic properties; Microstructure; Semiconductors; Ultrasonic measurements

Indexed keywords

DENSE SPECIMENS; ELASTIC PROPERTIES; ELECTRICAL AND MECHANICAL PROPERTIES; LEAD-ANTIMONY; LEAST SQUARES FIT; POISSON'S RATIO; POLYCRYSTALLINE SPECIMEN; POROSITY DEPENDENCE; RESONANT ULTRASOUND SPECTROSCOPY; ROOM TEMPERATURE; SEMICONDUCTORS; SHEAR MODULUS; THERMOELECTRIC MATERIAL; YOUNG'S MODULUS;

ANTIMONY; ELASTICITY; ELECTRIC PROPERTIES; MATERIALS PROPERTIES; MECHANICAL PROPERTIES; MICROSTRUCTURE; POISSON RATIO; POROSITY; SILVER; SPECTROSCOPY; TELLURIUM; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; ULTRASONIC MEASUREMENT; ULTRASONICS;

ELASTIC MODULI;

EID: 70350010194     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2009.08.018     Document Type: Article

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