On the bipolar and unipolar switching mechanisms observed in NiO memory cells made by thermal oxidation of Ni

2009 IEEE International Memory Workshop, IMW '09

Volumn , Issue , 2009, Pages

  Goux, L ^a   Lisoni, J G ^a   Courtade, L ^b   Muller, Ch ^c   Jurczak, M ^a   Wouters, D J ^a  

^a IMEC   (Belgium)

^b UNIVERSITÉ DE TOULON   (France)

^c AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349993197     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMW.2009.5090601     Document Type: Conference Paper

References (4)

1. J.F. Gibbon and W.E. Beadle, Solid State Electronics 7, p.785 (1964)
2. L. Courtade et al; IEEE Proc. NVMTS, p.1 (2007)
3. L. Courtade et al; IEEE Proc. ESSDERC, p.218 (2008)
4. U. Russo et al.; IEEE Proc. IEDM, p.775 (2007)