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Volumn 33, Issue 3, 2009, Pages 309-317

Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

Author keywords

BCR 2G; EMPA; LA ICP MS; MPI DING; NIST SRM; Reference materials; Selenium; SHRIMP

Indexed keywords


EID: 70349989279     PISSN: 16394488     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1751-908X.2009.00024.x     Document Type: Article
Times cited : (16)

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