Cycle test and degradation analysis of WO3/PC+LiClO4/CeO2·TiO 2 electrochromic device

Solar Energy Materials and Solar Cells

Volumn 93, Issue 12, 2009, Pages 2056-2061

  Kim, Chang Yeoul ^a   Cho, Seong Geun ^b   Lim, Tae Young ^a  

^a Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

CeO2 TiO2; Cycle test; Electrochromic device; Ion storage layer; Lithium ion diffusion; Long term stability

Indexed keywords

ANALYSIS RESULTS; CYCLABILITY; CYCLE TEST; CYCLE TESTS; DEGRADATION ANALYSIS; ELECTROCHROMICS; ION STORAGE; ION STORAGE LAYER; ITO THIN FILMS; LITHIUM ION DIFFUSION; LITHIUM IONS; LONG-TERM STABILITY; PC + LICLO; TIO; WATER ADDITION; WORKING ELECTRODE;

CELL MEMBRANES; DEGRADATION; DIFFUSION; ELECTROCHROMIC DEVICES; ELECTROCHROMISM; ELECTROOPTICAL DEVICES; LITHIUM; LITHIUM ALLOYS; SECONDARY ION MASS SPECTROMETRY;

IONS;

EID: 70349977157     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.07.007     Document Type: Article

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