Determination of critical micelle concentration of Aerosol-OT using time-of-flight secondary ion mass spectrometry fragmentation ion patterns

Langmuir

Volumn 25, Issue 19, 2009, Pages 11244-11249

  Burns, Sarah A ^a   Valint Jr , Paul L ^a   Gardella Jr , Joseph A ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOL OT; AGGREGATION PATTERNS; CHEMICAL STRUCTURE; CRITICAL MICELLE CONCENTRATION (CMC); FRAGMENTATION PATTERNS; HEAD GROUPS; LOW MASS; MASS REGIONS; MATRIX-ASSISTED LASER DESORPTION/IONIZATION MASS SPECTROMETRY; QUASI-MOLECULAR IONS; SODIUM BIS(2-ETHYLHEXYL) SULFOSUCCINATE; SULFATE ION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS ANALYSIS;

AGGREGATES; ANIONIC SURFACTANTS; ATMOSPHERIC AEROSOLS; CARBON TETRACHLORIDE; CONCENTRATION (PROCESS); CRITICAL MICELLE CONCENTRATION; DESORPTION; ELECTROSPRAY IONIZATION; FILM PREPARATION; MASS SPECTROMETERS; MICELLES; NEGATIVE IONS; SECONDARY EMISSION; SODIUM SULFATE; SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

EID: 70349925730     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la902343r     Document Type: Article

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