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Journal of Materials Chemistry

Volumn 19, Issue 29, 2009, Pages 5078-5088

Advances in total scattering analysis

(2) Proffen, Thomas a Kim, Hyunjeong a

a LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; BRAGG INTENSITY; CRYSTALLOGRAPHIC STRUCTURE; CURRENT TRENDS; DIFFUSE SCATTERING; LONG RANGE; MEDIUM RANGE; TOTAL SCATTERING;

NANOCRYSTALLINE MATERIALS;

SCATTERING;

EID: 70349899774 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/b821178g Document Type: Article

Times cited : (57)

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