Towards a measure of biometric feature information

Pattern Analysis and Applications

Volumn 12, Issue 3, 2009, Pages 261-270

  Adler, Andy ^a   Youmaran, Richard ^b   Loyka, Sergey ^b  

^a CARLETON UNIVERSITY   (Canada)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Biometric features; Face recognition; Information content; Relative entropy

Indexed keywords

EID: 70349860177     PISSN: 14337541     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10044-008-0120-3     Document Type: Article

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