Application of step-scan interferometry to dynamic infrared spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1145, Issue , 1989, Pages 277-279

  Palmer, Richard A ^a   Manning, Christopher J ^a   Rzepiela, Jeffrey A ^a   Widder, Jeffrey M ^a   Thomas, Paula J ^a   Chao, James L ^b   Marcott, Curtis ^c   Noda, Isao ^c  

^a DUKE UNIVERSITY   (United States)

^b NASA HEADQUARTERS   (United States)

^c PROCTER AND GAMBLE COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349723520     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.969460     Document Type: Conference Paper

References (5)

1. W. M. Grim, III, J. A. Graham, R. M. Hammaker, and W. G. Fateley, Am. Lab., 16, (3), 22, (1984).
2. M. J. Smith, C. J. Manning, R. A. Palmer, and J. L. Chao, Appl. Spectros., 42, 546, (1988).
3. D. Débarre, A. C. Boccara, and D. Fournier, Appl. Opt. 20, 4281 (1981).
4. R. A. Palmer, C. J. Manning, J. A. Rzepiela, J. M. Widder, and J. L. Chao, Appl. Spectros. 43, 193, (1989).
5. I. Noda, A. E. Dowrey and C. Marcott, Microchim. Acta [Wein]. 1, 101 (1988).