-
1
-
-
36449006418
-
-
0021-8979,. 10.1063/1.358781
-
D. Vion, P. F. Orfila, P. Joyez, D. Esteve, and M. H. Devoret, J. Appl. Phys. 0021-8979 77, 2519 (1995). 10.1063/1.358781
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 2519
-
-
Vion, D.1
Orfila, P.F.2
Joyez, P.3
Esteve, D.4
Devoret, M.H.5
-
2
-
-
16844373573
-
-
0163-1829,. 10.1103/PhysRevB.35.4682
-
J. M. Martinis, M. H. Devoret, and J. Clarke, Phys. Rev. B 0163-1829 35, 4682 (1987). 10.1103/PhysRevB.35.4682
-
(1987)
Phys. Rev. B
, vol.35
, pp. 4682
-
-
Martinis, J.M.1
Devoret, M.H.2
Clarke, J.3
-
3
-
-
0037350293
-
-
0034-6748,. 10.1063/1.1540721
-
K. Bladh, D. Gunnarsson, E. Hurfeld, S. Devi, C. Kristoffersson, B. Smalander, S. Pehrson, T. Claeson, and P. Delsing, Rev. Sci. Instrum. 0034-6748 74, 1323 (2003). 10.1063/1.1540721
-
(2003)
Rev. Sci. Instrum.
, vol.74
, pp. 1323
-
-
Bladh, K.1
Gunnarsson, D.2
Hurfeld, E.3
Devi, S.4
Kristoffersson, C.5
Smalander, B.6
Pehrson, S.7
Claeson, T.8
Delsing, P.9
-
4
-
-
0031121827
-
-
0018-9456,. 10.1109/19.571834
-
A. Fukushima, A. Sato, A. Iwasa, Y. Nakamura, T. Komatsuzaki, and Y. Sakamoto, IEEE Trans. Instrum. Meas. 0018-9456 46, 289 (1997). 10.1109/19.571834
-
(1997)
IEEE Trans. Instrum. Meas.
, vol.46
, pp. 289
-
-
Fukushima, A.1
Sato, A.2
Iwasa, A.3
Nakamura, Y.4
Komatsuzaki, T.5
Sakamoto, Y.6
-
5
-
-
33746782886
-
-
0034-6748, () 10.1063/1.2221541;, Phys. Rev. Lett. 0031-9007 97, 036810 (2006). 10.1103/PhysRevLett.97.036810
-
L. DiCarlo, Y. Zhang, D. T. McClure, C. M. Marcus, L. N. Pfeiffer, and K. W. West, Rev. Sci. Instrum. 0034-6748 77, 073906 (2006) 10.1063/1.2221541; L. DiCarlo, Y. Zhang, D. T. McClure, D. J. Reilly, C. M. Marcus, L. N. Pfeiffer, and K. W. West, Phys. Rev. Lett. 0031-9007 97, 036810 (2006). 10.1103/PhysRevLett.97.036810
-
(2006)
Rev. Sci. Instrum.
, vol.77
, pp. 073906
-
-
Dicarlo, L.1
Zhang, Y.2
McClure, D.T.3
Marcus, C.M.4
Pfeiffer, L.N.5
West, K.W.6
Dicarlo, L.7
Zhang, Y.8
McClure, D.T.9
Reilly, D.J.10
Marcus, C.M.11
Pfeiffer, L.N.12
West, K.W.13
-
6
-
-
45749124321
-
-
1610-1634,. 10.1002/pssc.200776535
-
M. Hashisaka, S. Nakamura, Y. Yamauchi, S. Kasai, K. Kobayashi, and T. Ono, Phys. Status Solidi C 1610-1634 5, 182 (2007). 10.1002/pssc.200776535
-
(2007)
Phys. Status Solidi C
, vol.5
, pp. 182
-
-
Hashisaka, M.1
Nakamura, S.2
Yamauchi, Y.3
Kasai, S.4
Kobayashi, K.5
Ono, T.6
-
7
-
-
44649178659
-
-
1742-6588,. 10.1088/1742-6596/109/1/012013
-
M. Hashisaka, Y. Yamauchi, S. Nakamura, S. Kasai, K. Kobayashi, and T. Ono, J. Phys.: Conf. Ser. 1742-6588 109, 012013 (2008). 10.1088/1742-6596/109/1/ 012013
-
(2008)
J. Phys.: Conf. Ser.
, vol.109
, pp. 012013
-
-
Hashisaka, M.1
Yamauchi, Y.2
Nakamura, S.3
Kasai, S.4
Kobayashi, K.5
Ono, T.6
-
8
-
-
70349666156
-
-
(personal communication). The capacitance of the pseudopowder filter depends on how thick the insulating Formvar around the copper line is. We used standard commercial copper wires covered by Formvar as an inner conductor of the filter. The thickness of the Formvar of the wire is 0.05-0.1 mm. In this case, the filter has typically 1-2 nF/m capacitance between the signal line and the ground line
-
Y. Chung and N. Ofek (personal communication). The capacitance of the pseudopowder filter depends on how thick the insulating Formvar around the copper line is. We used standard commercial copper wires covered by Formvar as an inner conductor of the filter. The thickness of the Formvar of the wire is 0.05-0.1 mm. In this case, the filter has typically 1-2 nF/m capacitance between the signal line and the ground line.
-
-
-
Chung, Y.1
Ofek, N.2
|