Accurate Measurements of second-order nonlinear optical coefficients of 6H and 4H silicon carbide

Journal of the Optical Society of America B: Optical Physics

Volumn 26, Issue 10, 2009, Pages 1892-1896

  Sato, Hiroaki ^a   Abe, Makoto ^b   Shoji, Ichiro ^a   Suda, Jun ^c   Kondo, Takashi ^b  

^a CHUO UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON CARBIDE;

4H SILICON CARBIDE; ACCURATE MEASUREMENT; FUNDAMENTAL WAVELENGTH; MULTIPLE REFLECTIONS; NON-LINEAR OPTICAL COEFFICIENTS; RIGOROUS ANALYSIS; ROTATIONAL MAKER FRINGES; SECOND-ORDER NONLINEAR OPTICAL COEFFICIENT;

NONLINEAR OPTICS;

EID: 70349684336     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.26.001892     Document Type: Article

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