On the compliance of Simbol-X mirror roughness with its effective area requirements

AIP Conference Proceedings

Volumn 1126, Issue , 2009, Pages 41-43

  Spiga, D ^a   Basso, S ^a   Cotroneo, V ^a   Pareschi, G ^a   Tagliaferri, G ^a  

^a INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

Author keywords

Effective area; Roughness tolerance; Simbol X

Indexed keywords

EID: 70349681869     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3149460     Document Type: Conference Paper

References (4)

1. G. Pareschi, Mem. SAIT 79, 2008, pp. 26-31.
2. V. Cotroneo, S. Basso, G. Pareschi, Mem. SAIT 79, 2008, pp. 239-241.
3. E. L. Church, and P. Z. Takács, in SPIE Proc. 640, 1986, 125-136.
4. D. Spiga, Mem. SAIT 79, 2008, pp. 278-280.