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Volumn , Issue , 2009, Pages 36-43
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Automated test program generation for an industrial optimizing compiler
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATED APPROACH;
AUTOMATED TEST;
BENCHMARK TESTING;
CHINESE ACADEMY OF SCIENCES;
COMPILER OPTIMIZATIONS;
ELECTRIC INDUSTRIAL CO.;
INTEGRATED TOOLS;
LOGIC MODELS;
MATSUSHITA;
OPTIMIZING COMPILERS;
TEST PROGRAM;
TEST REQUIREMENTS;
AUTOMATIC PROGRAMMING;
AUTOMATION;
COMPUTER SOFTWARE;
TEMPORAL LOGIC;
TEST FACILITIES;
TESTING;
PROGRAM COMPILERS;
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EID: 70349671765
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IWAST.2009.5069039 Document Type: Conference Paper |
Times cited : (30)
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References (15)
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