SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 9, 2009, Pages

How to measure forces with atomic force microscopy without significant influence from nonlinear optical lever sensitivity

(3) Thormann, Esben a Pettersson, Torbjön a Claesson, Per M a

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; CANTILEVER DEFLECTION; DESIGNED EXPERIMENTS; DETECTOR RESPONSE; EXPERIMENTAL CONDITIONS; NON-LINEAR OPTICAL; NON-LINEAR RELATIONSHIPS; NON-LINEARITY; OPTICAL LEVER; RULE OF THUMB;

NANOCANTILEVERS; OPTICAL MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 70349667392 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3194048 Document Type: Article

Times cited : (51)

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