Determination of some kinetic parameters of fast surface states in silicon single crystals by means of surface acoustic wave method

Acta Physica Polonica A

Volumn 114, Issue 6 A, 2008, Pages

  Pustelny, T ^a   Opilski, A ^a   Pustelny, B ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ACOUSTIC WAVES; CARRIER LIFETIME; SILICON; SINGLE CRYSTALS;

ACOUSTIC METHOD; EFFECTIVE CARRIER LIFETIMES; NEAR SURFACE REGIONS; PHONON-ELECTRON; SI (1 1 1); SILICON SINGLE CRYSTALS; SURFACE ACOUSTIC WAVES;

SURFACE STATES;

EID: 70349665699     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/aphyspola.114.a-183     Document Type: Article

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