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Volumn , Issue , 2009, Pages 214-216
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Interconnection with copper pillar bumps : Process and applications
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER PILLARS;
CU BUMPS;
CU PILLAR;
ELECTRICAL PERFORMANCE;
FINE PITCH;
FLIP CHIP TECHNOLOGIES;
GREEN SOLUTION;
MIGRATION EFFECTS;
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EID: 70349469831
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IITC.2009.5090391 Document Type: Conference Paper |
Times cited : (16)
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References (3)
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