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Volumn 43, Issue 7, 2009, Pages 963-967

Effect of carrier gas and doping profile on the surface morphology of MOVPE grown heavily doped GaN:Mg layers

Author keywords

61.72.uj; 68.37.Ps; 81.05.Ea; 81.15.Gh

Indexed keywords


EID: 70349443599     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063782609070276     Document Type: Article
Times cited : (20)

References (12)
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    • I. F. Chetverikova, M. V. Chukichev, and A. P. Khramtsov, Rep. on Electron. Techn., Ser. 6: Mater., No. 8, 911 (1982); Rep. on Electron. Techn., Ser. 6: Mater., No. 8, 945 (1983)
    • I. F. Chetverikova, M. V. Chukichev, and A. P. Khramtsov, Rep. on Electron. Techn., Ser. 6: Mater., No. 8, 911 (1982); Rep. on Electron. Techn., Ser. 6: Mater., No. 8, 945 (1983).
  • 5
    • 70349464026 scopus 로고    scopus 로고
    • I. P. Smirnova, D. A. Zakgeim, M. M. Kulagina, and L. K. Markov, in Proc. of the 4th All-Russ. Conf. on Nitrides of Hallium, Indium, and Aluminium (Moscow, 2005), p. 134
    • I. P. Smirnova, D. A. Zakgeim, M. M. Kulagina, and L. K. Markov, in Proc. of the 4th All-Russ. Conf. on Nitrides of Hallium, Indium, and Aluminium (Moscow, 2005), p. 134.
  • 6
    • 70349447691 scopus 로고    scopus 로고
    • D. P. Griffis, R. Loesing, D. A. Ricks, M. D. Bremser, and R. F. Davis, in Proc. of the 11th Intern. Conf. on Secondary Ion Mass Spectrometry, Orlando, Florida, Sept. 7-12, 1997 (Wiley, 1998), p. 201
    • D. P. Griffis, R. Loesing, D. A. Ricks, M. D. Bremser, and R. F. Davis, in Proc. of the 11th Intern. Conf. on Secondary Ion Mass Spectrometry, Orlando, Florida, Sept. 7-12, 1997 (Wiley, 1998), p. 201.
  • 7
    • 70349455774 scopus 로고    scopus 로고
    • B. Schineller, A. Guttzeit, O. Schon, M. Heuken, K. Heim, and R. Beccard, in Proc. of the Int. Conf. on Silicon Carbide, III-Nitrides and Related Materials (Stockholm, Sweeden, 1997), p. 548
    • B. Schineller, A. Guttzeit, O. Schon, M. Heuken, K. Heim, and R. Beccard, in Proc. of the Int. Conf. on Silicon Carbide, III-Nitrides and Related Materials (Stockholm, Sweeden, 1997), p. 548.
  • 8
    • 33746621744 scopus 로고    scopus 로고
    • T. Wunderer, P. Brückner, B. Neubert, F. Scholz, M. Feneberg, F. Lipski, M. Schirra, and K. Thonke, Appl. Phys. Lett. 89, 041121 (2006)
    • T. Wunderer, P. Brückner, B. Neubert, F. Scholz, M. Feneberg, F. Lipski, M. Schirra, and K. Thonke, Appl. Phys. Lett. 89, 041121 (2006).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.