Microstructure and microwave dielectric characteristics of CaO-B 2O 3-SiO 2 glass ceramics

Journal of Materials Science: Materials in Electronics

Volumn 20, Issue 11, 2009, Pages 1135-1139

  Zhu, Haikui ^a   Zhou, Hongqing ^a   Liu, Min ^a   Wei, Pengfei ^a   Xu, Guijun ^a   Ning, Ge ^a  

^a NANJING TECH UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS ADDITION; GLASS MELTING; GLASS POWDER; MICROWAVE DIELECTRICS; PROPERTIES AND MICROSTRUCTURES; SEM; SINTERING TEMPERATURES;

CERAMIC CAPACITORS; CONTEXT SENSITIVE GRAMMARS; DIELECTRIC PROPERTIES; ELECTRIC CIRCUIT BREAKERS; GLASS MANUFACTURE; MELTING POINT; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SINTERING; TANNING; THERMOANALYSIS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

GLASS CERAMICS;

EID: 70349430147     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-008-9839-2     Document Type: Article

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