-
1
-
-
24944573540
-
-
Tran D.T., Fan X.-J., Brennan D.P., Zavalij P.Y., and Oliver S.R.J. Inorg. Chem. 44 (2005) 6192-6196
-
(2005)
Inorg. Chem.
, vol.44
, pp. 6192-6196
-
-
Tran, D.T.1
Fan, X.-J.2
Brennan, D.P.3
Zavalij, P.Y.4
Oliver, S.R.J.5
-
2
-
-
70349430265
-
-
Manuscript, submitted for publication
-
D.T. Tran, N.A. Chernova, D. Chu, A.G. Oliver, S.R.J. Oliver, Manuscript, submitted for publication.
-
-
-
Tran, D.T.1
Chernova, N.A.2
Chu, D.3
Oliver, A.G.4
Oliver, S.R.J.5
-
4
-
-
0033024660
-
-
Mahony D.E., Lim-Morrison S., Bryden L., Faulkner G., Hoffman P.S., Agocs L., Briand G.G., Burford N., and Maguire H. Antimicrob. Agents Chemother. 43 (1999) 582-588
-
(1999)
Antimicrob. Agents Chemother.
, vol.43
, pp. 582-588
-
-
Mahony, D.E.1
Lim-Morrison, S.2
Bryden, L.3
Faulkner, G.4
Hoffman, P.S.5
Agocs, L.6
Briand, G.G.7
Burford, N.8
Maguire, H.9
-
5
-
-
0242432401
-
-
Csajbok E., Baranyai Z., Banyai I., Brucher E., Kiraly R., Muller-Fahrnow A., Platzek J., Raduchel B., and Schafer M. Inorg. Chem. 42 (2003) 2342-2349
-
(2003)
Inorg. Chem.
, vol.42
, pp. 2342-2349
-
-
Csajbok, E.1
Baranyai, Z.2
Banyai, I.3
Brucher, E.4
Kiraly, R.5
Muller-Fahrnow, A.6
Platzek, J.7
Raduchel, B.8
Schafer, M.9
-
8
-
-
0039470547
-
-
Devillers M., Tirions O., Cadus L., Ruiz P., and Delmon B. J. Solid State Chem. 126 (1996) 152-160
-
(1996)
J. Solid State Chem.
, vol.126
, pp. 152-160
-
-
Devillers, M.1
Tirions, O.2
Cadus, L.3
Ruiz, P.4
Delmon, B.5
-
14
-
-
33749844452
-
-
Andrews P.C., Deacon G.B., Junk P.C., Kumar I., and Silberstein M. Dalton Trans. (2006) 4852-4858
-
(2006)
Dalton Trans.
, pp. 4852-4858
-
-
Andrews, P.C.1
Deacon, G.B.2
Junk, P.C.3
Kumar, I.4
Silberstein, M.5
-
18
-
-
0038674665
-
-
Briand G.G., Burford N., Eelman M.D., Cameron T.S., and Robertson K.N. Inorg. Chem. 42 (2003) 3136-3141
-
(2003)
Inorg. Chem.
, vol.42
, pp. 3136-3141
-
-
Briand, G.G.1
Burford, N.2
Eelman, M.D.3
Cameron, T.S.4
Robertson, K.N.5
-
19
-
-
4644304803
-
-
Briand G.G., Burford N., Eelman M.D., Aumeerally N., Chen L., Cameron T.S., and Robertson K.N. Inorg. Chem. 43 (2004) 6495-6500
-
(2004)
Inorg. Chem.
, vol.43
, pp. 6495-6500
-
-
Briand, G.G.1
Burford, N.2
Eelman, M.D.3
Aumeerally, N.4
Chen, L.5
Cameron, T.S.6
Robertson, K.N.7
-
22
-
-
57949086401
-
-
Liu L., Zakharov L.N., Golen J.A., Rheingold A.L., and Hanna T.A. Inorg. Chem. 47 (2008) 11143-11153
-
(2008)
Inorg. Chem.
, vol.47
, pp. 11143-11153
-
-
Liu, L.1
Zakharov, L.N.2
Golen, J.A.3
Rheingold, A.L.4
Hanna, T.A.5
-
24
-
-
70349418692
-
-
note
-
2O (Aldrich, 98+%) and 0.25 g of pdc (Matrix Scientific, 95%) were added to a Nalgene beaker. After ca. 15 min. stirring, the solution was transferred to a 45 mL capacity Teflon-lined stainless steel autoclave. The autoclave was sealed and heated at 130 to 200 °C for 3 days. The crystals were collected by vacuum filtration, rinsed with deionized water and allowed to air-dry overnight. The crystal product from 130 °C weighed ca. 770 mg (yield: 83.7%). The crystal product from 165 °C weighed ca. 790 mg (yield: 85.9%), while the 200 °C product yielded a total of 809 mg (yield: 87.9%). Elemental analysis (Galbraith Laboratories Inc., Knoxville, TN) agrees well with the structural formula. Analyzed percentages of C, H and N were 9.39%, < 0.5% and 2.28%, compared with 13.6%, 0.48% and 2.28% calculated from the structure solution, respectively.
-
-
-
-
25
-
-
70349422713
-
-
note
-
2 = 0.0654 for all 1919 data. Frames corresponding to an arbitrary sphere of data were collected using ω-scans of 0.3° counted for a total of 1 s per frame. Data were integrated by the program saint [26b] to a maximum θ-value of 31.07°. The data were corrected for Lorentz and polarization effects, then analyzed for agreement and possible absorption using xprep [26c]. An empirical absorption correction based on comparison of redundant and equivalent reflections was applied using sadabs [26d]. The structure was solved by direct methods [26e] and expanded using Fourier techniques [26f].
-
-
-
-
26
-
-
70349417019
-
-
APEX-II: Area-Detector Software Package v2.1, Bruker Analytical X-ray Systems Inc., Madison, WI, 2006.
-
APEX-II: Area-Detector Software Package v2.1, Bruker Analytical X-ray Systems Inc., Madison, WI, 2006.
-
-
-
-
28
-
-
70349427622
-
-
XPREP: (v 6.14) Part of the shelxtl Crystal Structure Determination Package, Siemens Industrial Automation Inc., Madison, WI, 1995.
-
XPREP: (v 6.14) Part of the shelxtl Crystal Structure Determination Package, Siemens Industrial Automation Inc., Madison, WI, 1995.
-
-
-
-
29
-
-
70349412119
-
-
SADABS: Siemens Area Detector Absorption correction Program v.2.10, George Sheldrick, 2005.
-
SADABS: Siemens Area Detector Absorption correction Program v.2.10, George Sheldrick, 2005.
-
-
-
-
30
-
-
70349418325
-
-
XS: Program for the Solution of X-ray Crystal Structures, Part of the shelxtl Crystal Structure Determination Package, Bruker Analytical X-ray Systems Inc., Madison, WI, 1995-99.
-
XS: Program for the Solution of X-ray Crystal Structures, Part of the shelxtl Crystal Structure Determination Package, Bruker Analytical X-ray Systems Inc., Madison, WI, 1995-99.
-
-
-
-
31
-
-
70349434160
-
-
XL: Program for the Refinement of X-ray Crystal Structure, Part of the shelxtl Crystal Structure Determination Package, Bruker Analytical X-ray Systems Inc., Madison, WI, 1995-99.
-
XL: Program for the Refinement of X-ray Crystal Structure, Part of the shelxtl Crystal Structure Determination Package, Bruker Analytical X-ray Systems Inc., Madison, WI, 1995-99.
-
-
-
-
33
-
-
34948867344
-
-
Rogow D.L., Zapeda G., Swanson C.H., Fan X., Oliver A.G., and Oliver S.R.J. Chem. Mater. 19 (2007) 4658-4662
-
(2007)
Chem. Mater.
, vol.19
, pp. 4658-4662
-
-
Rogow, D.L.1
Zapeda, G.2
Swanson, C.H.3
Fan, X.4
Oliver, A.G.5
Oliver, S.R.J.6
|