-
1
-
-
0001677658
-
Scherrer after sixty years: A survey and some new results in the determination of crystallite size
-
J. I. Langford, A. J. C. Wilson: Scherrer after Sixty Years: A Survey and Some New Results in the Determination of crystallite Size. J. Applied Crystallography. 11:102-113(1978).
-
(1978)
J. Applied Crystallography
, vol.11
, pp. 102-113
-
-
Langford, J.I.1
Wilson, A.J.C.2
-
2
-
-
0342990921
-
X-ray line broadening in metals
-
W. H. Hall: X-ray Line Broadening in Metals. Proc. Phys. Soc. London A62:741-743(1949).
-
(1949)
Proc. Phys. Soc. London
, vol.A62
, pp. 741-743
-
-
Hall, W.H.1
-
3
-
-
0001461385
-
Use of the voigt function in a single-line method for the analysis of x-ray diffraction line broadening
-
Th. H. DE Keijser, J. I. Langford, E. J. Mittemeijer, A. B. P. Vogels: Use of the Voigt Function in a Single-Line Method for the Analysis of X-ray Diffraction Line Broadening. J. Applied Crystallography. 15:308-314(1982).
-
(1982)
J. Applied Crystallography
, vol.15
, pp. 308-314
-
-
De Keijser, Th.H.1
Langford, J.I.2
Mittemeijer, E.J.3
Vogels, A.B.P.4
-
4
-
-
84974183651
-
XRD microstructural characterization of tetragonal pure zirconia powders obtained by controlled hydrolysis of zirconium alkoxides
-
P. Scardi, L. Lutterotti, R. Di Maggio: XRD Microstructural Characterization of Tetragonal Pure Zirconia Powders Obtained by Controlled Hydrolysis of Zirconium Alkoxides. Power Diffraction 6(1):20-25(1991).
-
(1991)
Power Diffraction
, vol.6
, Issue.1
, pp. 20-25
-
-
Scardi, P.1
Lutterotti, L.2
Di Maggio, R.3
-
6
-
-
0000345778
-
A Numerical fourier-analysis method for the correction of widths and shapes of lines on x-ray powder photographs
-
R. Stokes: A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of lines on X-ray Powder Photographs Proc. Phys. Soc. London 61:382-391(1948).
-
(1948)
Proc. Phys. Soc. London
, vol.61
, pp. 382-391
-
-
Stokes, R.1
-
7
-
-
84926111268
-
A profile-fitting procedure for analysis of broadened x-ray diffraction peaks. I. Methodology
-
S. Enzo, G. Fagherazzi, A. Benedetti and S. Polizzi: A Profile-fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks. I. Methodology. J. Applied Crystallography. 21:536-542(1988).
-
(1988)
J. Applied Crystallography
, vol.21
, pp. 536-542
-
-
Enzo, S.1
Fagherazzi, G.2
Benedetti, A.3
Polizzi, S.4
-
8
-
-
0005470927
-
An analysis of the effect of different instrumental conditions on the shapes of x- ray powder line profiles
-
R. W. Cheary, James P. Cline: An Analysis of the Effect of Different Instrumental conditions on the Shapes of X- ray Powder Line Profiles. Advances in X-Ray Analysis 38:75-82(1995).
-
(1995)
Advances in X-Ray Analysis
, vol.38
, pp. 75-82
-
-
Cheary, R.W.1
Cline, J.P.2
-
9
-
-
0000877193
-
Peak shape and resolution in diffractometry with monochromatic x-rays
-
D. Louer, J. I. Langford: Peak Shape and Resolution in Diffractometry with Monochromatic X-rays. J. Applied Crystallography. 21:430-437(1988).
-
(1988)
J. Applied Crystallography
, vol.21
, pp. 430-437
-
-
Louer, D.1
Langford, J.I.2
-
10
-
-
0024124695
-
Profile analysis for macrocrystalline properties by the fourier and other methods
-
I. Langford, R. Delhez, Th. H. DE Keijser, E. J. Mittemeijer: Profile Analysis for Macrocrystalline Properties by the Fourier and Other Methods. Aust. J. Phys 41:173-87(1988).
-
(1988)
Aust. J. Phys
, vol.41
, pp. 173-187
-
-
Langford, I.1
Delhez, R.2
De Keijser, Th.H.3
Mittemeijer, E.J.4
-
11
-
-
0026932912
-
Profile fitting of x-ray diffraction lines and fourier analysis of broadening
-
D. Balzer: Profile Fitting of X-ray Diffraction Lines and Fourier Analysis of Broadening. J. Applied Crystallography. 25.559-570( 1992).
-
(1992)
J. Applied Crystallography
, vol.25
, pp. 559-570
-
-
Balzer, D.1
-
12
-
-
0001719893
-
A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis
-
D. Louer, J. P. Auffredic, J. I. Langford, D. Ciosmak, J. C. Niepce: A Precise Determination of the Shape, Size and Distribution of Size of Crystallites in Zinc Oxide by X-ray Line-Broadening Analysis. J. Applied Crystallography. 16:183-191(1983).
-
(1983)
J. Applied Crystallography
, vol.16
, pp. 183-191
-
-
Louer, D.1
Auffredic, J.P.2
Langford, J.I.3
Ciosmak, D.4
Niepce, J.C.5
-
13
-
-
0000628445
-
The determination of crystallite and lattice-strain parameters in conjunction with the profile-refinement method for the determination of crystal structures
-
Th. H. DE Keijser, E. J. Mittemeijer, H. C. F. Rozendaaf: The Determination of crystallite and Lattice-Strain Parameters in Conjunction with the Profile-Refinement Method for the Determination of Crystal Structures. J. Applied Crystallography 16:309-316(1983).
-
(1983)
J. Applied Crystallography
, vol.16
, pp. 309-316
-
-
De Keijser, Th.H.1
Mittemeijer, E.J.2
Rozendaaf, H.C.F.3
-
14
-
-
3142765611
-
Some application of pattern fitting to powder diffraction data
-
J. I. Langford: Some Application of Pattern Fitting to Powder Diffraction Data. Crystal Growth and Charact 14:185-211(1987).
-
(1987)
Crystal Growth and Charact
, vol.14
, pp. 185-211
-
-
Langford, J.I.1
-
15
-
-
0027544935
-
The use of pattern decomposition to study the combined X- ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide
-
J. I. Langford, A. Boultif, J. P. Auffredic, D. Louer: The Use of Pattern Decomposition to Study the Combined X- ray Diffraction Effects of Crystallite Size and Stacking Faults in Ex-Oxalate Zinc Oxide. J. Applied Crystallography. 26:22-33(1993).
-
(1993)
J. Applied Crystallography
, vol.26
, pp. 22-33
-
-
Langford, J.I.1
Boultif, A.2
Auffredic, J.P.3
Louer, D.4
|