A review of statistical modelling and inference for electrical capacitance tomography

Measurement Science and Technology

Volumn 20, Issue 5, 2009, Pages

  Watzenig, D ^a   Fox, C ^b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF OTAGO   (New Zealand)

Author keywords

Bayesian inference; Electrical capacitance tomography; Markov chain Monte Carlo; Statistical inversion

Indexed keywords

APRIORI; BAYESIAN; BAYESIAN INFERENCE; DISCRETIZATION ERRORS; ELECTRICAL CAPACITANCE TOMOGRAPHY; KEY COMPONENT; LIKELIHOOD FUNCTIONS; MARKOV CHAIN MONTE CARLO; MEASURED DATA; MEASUREMENT NOISE; MEASUREMENT SENSITIVITY; METROPOLIS-HASTINGS ALGORITHM; MODEL FITTING; MODEL INACCURACY; NUMERICAL SIMULATION; OTHER APPLICATIONS; PARAMETRIZATIONS; POSTERIOR DISTRIBUTIONS; RANDOM PARTS; REFERENCE SOLUTION; SPEED-UPS; STATISTICAL INVERSION; STATISTICAL MODELLING; SUMMARY STATISTIC; UNKNOWN QUANTITY;

BAYESIAN NETWORKS; CAPACITANCE; COMPUTATIONAL EFFICIENCY; COMPUTER SIMULATION; DIFFERENTIAL EQUATIONS; INFERENCE ENGINES; INVERSE PROBLEMS; MARKOV PROCESSES; MONTE CARLO METHODS; PERMITTIVITY; SAMPLING; TOMOGRAPHY; UNCERTAIN SYSTEMS;

UNCERTAINTY ANALYSIS;

EID: 70349334007     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/5/052002     Document Type: Article

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