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Volumn 55, Issue 2 PART 1, 2009, Pages 799-802
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Measurement of the BaTiO3 domain structure by using ultrahigh-vacuum atomic force microscopy (UHV-AFM)
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Author keywords
Domain; Ferroelectric; Nano scale
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Indexed keywords
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EID: 70349320598
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: 10.3938/jkps.55.799 Document Type: Article |
Times cited : (10)
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References (8)
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