Volatiles are miscompiled, and what to do about it

Proceedings of the 8th ACM International Conference on Embedded Software, EMSOFT'08

Volumn , Issue , 2008, Pages 255-264

  Eide, Eric ^a   Regehr, John ^a  

^a UNIVERSITY OF UTAH   (United States)

Author keywords

Automated testing; Compiler defect; Compiler testing; Random program generation; Random testing; Volatile

Indexed keywords

APPLICATION PROGRAMS; AUTOMATIC PROGRAMMING; CODES (SYMBOLS); DEFECTS; EMBEDDED SOFTWARE; EMBEDDED SYSTEMS; PROGRAM COMPILERS; PROGRAM DEBUGGING; SAFETY ENGINEERING; SOFTWARE TESTING;

AUTOMATED TESTING; COMPILER DEFECTS; COMPILER TESTING; PROGRAM GENERATION; RANDOM TESTING; VOLATILE;

C (PROGRAMMING LANGUAGE);

EID: 70349302162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1450058.1450093     Document Type: Conference Paper

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