SAW RFID spread spectrum OFC and TDM technology

2009 IEEE International Conference on RFID, RFID 2009

Volumn , Issue , 2009, Pages 110-116

  Pavlina, J M ^a   Kozlovski, N ^a   Santos, B ^a   Malocha, D C ^a  

^a University of Central Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLING-OF-MODES MODELS; HARSH ENVIRONMENT; ORTHOGONAL FREQUENCIES; PROCESSING GAIN; PROTOTYPE SENSOR; RADIATION HARD; RFID SENSORS; SAW TECHNOLOGY; SENSOR APPLICATIONS; SPACE EXPLORATIONS; SPREAD SPECTRA; TEMPERATURE RANGE; TRANSCEIVER DESIGN;

ACOUSTIC SURFACE WAVE DEVICES; NASA; POWER SPECTRAL DENSITY; SAWING; SPACE FLIGHT; SPECTROSCOPY; TIME DIVISION MULTIPLEXING;

SENSORS;

EID: 70349275755     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RFID.2009.4911213     Document Type: Conference Paper

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