Controlling temperature coefficient of resistivity in La1-xSrxMnO3 ceramics

Materials Letters

Volumn 63, Issue 28, 2009, Pages 2452-2455

  Kagomiya, Isao ^a   Matsumoto, Shinji ^a   Kakimoto, Ken ichi ^a   Ohsato, Hitoshi ^a   Sakai, Hiroshi ^b   Maeda, Yukinori ^b  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b Earth Wing Corporate Headquarters KOA Pine Park   (Japan)

Author keywords

La1 xSrxMnO3; Lead free and ruthenium free conductive oxide; TCR; Thick film resistor

Indexed keywords

CONDUCTIVE OXIDES; LA1-XSRXMNO3; LEAD-FREE; LEAD-FREE AND RUTHENIUM-FREE CONDUCTIVE OXIDE; METALLIC BEHAVIORS; MN IONS; MOTT INSULATORS; TCR; TEMPERATURE COEFFICIENT OF RESISTIVITY; THICK FILM RESISTOR; THICK FILM RESISTORS;

CRYSTAL SYMMETRY; MANGANESE; MANGANESE COMPOUNDS; RESISTORS; RUTHENIUM; THERMAL CONDUCTIVITY OF SOLIDS; THICK FILMS;

ELECTRIC REACTORS;

EID: 70349253865     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2009.08.032     Document Type: Article

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