Scale-invariant pattern recognition using a combined mellin radial harmonic function and the bidimensional empirical mode decomposition

Optics Express

Volumn 17, Issue 19, 2009, Pages 16581-16589

  Qingbo, Y I N ^a,b   Shen, Liran ^c   Jong Nam, K I M ^b   Jeong, Yong Jae ^a  

^a HARBIN ENGINEERING UNIVERSITY   (China)

^b Division of Electronic Computer and Telecommunication Engineering   (China)

^c Pukyong National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC FUNCTIONS; WHITE NOISE;

BI-DIMENSIONAL EMPIRICAL MODE DECOMPOSITIONS; CORRELATION PEAK INTENSITY; GLOBAL THRESHOLD; HARMONIC DECOMPOSITION; NOISE ROBUSTNESS; PEAK INTENSITY; SCALE INVARIANT; SHIFT INVARIANT;

PATTERN RECOGNITION;

EID: 70349199584     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/oe.17.016581     Document Type: Article

References (6)

1. D. Mendlovic, E. Maron, and N. Konforti, "Shift and scale invariant pattern recognition using Mellin radial harmonics," Opt. Commun. 67, 172-176(1988).
2. A. Moya, J. J. Esteve-Taboada, J. Garcia, and C. "Ferreira, Shift- and scale-invariant recognition of contour objects with logarithmic radial harmonic filters," Appl. Opt. 39, 5347-5351(2000).
3. Yih-Shyang Cheng and Hui-Chi Chen, "Improved performance of scale-invariant pattern recognition using a combined Mellin radial harmonic function and wavelet transform," Opt. Eng. 46, 107204 (Oct. 29,2007)
4. J. C. Nunes, Y. Bouaoune, E. Del'échelle, O. Niang, and Ph.Bunel, "Image analysis by bidimensional empirical mode decomposition," Image Vision Comput. 21, 1019-1026(2003).
5. C. Damerval, S. Meignen, and V. Perrier, "A fast algorithm for bidimensional EMD," IEEE Signal Process Lett. 12,701-704 (2005).
6. C. Damerval, "BEMD Toolbox : Bidimensional Empirical Mode Decomposition". http://ljk.imag.fr/membres/Christophe.Damerval/software. html