Tailored polymer-metal fractal nanocomposites: An approach to highly active surface enhanced Raman scattering substrates

Nanotechnology

Volumn 20, Issue 32, 2009, Pages

  Biswas, Abhijit ^a   Bayer, Ilker S ^b   Dahanayaka, Daminda H ^a   Bumm, Lloyd A ^a   Li, Zhongrui ^c   Watanabe, Fumiya ^c   Sharma, Rajesh ^d   Xu, Yang ^c   Biris, Alexandru S ^c   Norton, M Grant ^e   Suhir, Ephraim ^f,g,h  

^a UNIVERSITY OF OKLAHOMA   (United States)

^b University of Illinois at Urbana Champaign   (United States)

^c University of Arkansas   (United States)

^d ARKANSAS STATE UNIVERSITY   (United States)

^e Washington State University   (United States)

^f University of California Santa Cruz   (United States)

^g UNIVERSITY OF MARYLAND   (United States)

^h ERS CO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE SURFACES; AG NANOPARTICLE; ANALYSIS OF VARIOUS; CHEMICAL SAMPLES; DEOXYRIBONUCLEIC ACIDS; DESIGN APPROACHES; DIRECT DETECTION; ELECTROMAGNETIC ENERGY; HOT SPOT; METAL NANOPARTICLES; NANO SCALE; NANO-COMPOSITE STRUCTURE; NANOCOMPOSITE FILM; NANOMORPHOLOGIES; NANOSTRUCTURAL; NOVEL ROUTE; PERCOLATION THRESHOLDS; PLASMA ETCHING PROCESS; POLYMER STRUCTURE; RAMAN SIGNAL; SERS ENHANCEMENT; SERS SUBSTRATE; SURFACE-ENHANCED RAMAN SCATTERING;

AGGLOMERATION; BIOLOGICAL SYSTEMS; ELECTROMAGNETIC WAVES; FRACTALS; NANOCOMPOSITES; NANOPARTICLES; ORGANIC ACIDS; PLASMA ETCHING; POLYMERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILVER; SOLVENTS; SURFACE ROUGHNESS; SURFACES; VAN DER WAALS FORCES;

SUBSTRATES;

DOUBLE STRANDED DNA; GOLD NANOPARTICLE; NANOCOMPOSITE; NANOFILM; POLYMER; BUFFER; DNA; SILVER;

ARTICLE; ELECTROMAGNETIC FIELD; ENERGY; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SURFACE PROPERTY; ANIMAL; ATOMIC FORCE MICROSCOPY; CHEMISTRY; FRACTAL ANALYSIS; MALE; METABOLISM; METHODOLOGY; SALMON; SOLUTION AND SOLUBILITY; ULTRASTRUCTURE; X RAY DIFFRACTION;

ANIMALS; BUFFERS; DNA; FRACTALS; MALE; MICROSCOPY, ATOMIC FORCE; NANOCOMPOSITES; POLYMERS; SALMON; SILVER; SOLUTIONS; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 70349125069     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/32/325705     Document Type: Article

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