Silicon crystal for channelling of negatively charged particles

Journal of Physics D: Applied Physics

Volumn 42, Issue 18, 2009, Pages

  Guidi, V ^a   Mazzolari, A ^a   De Salvador, D ^b   Carnera, A ^b  

^a UNIVERSITY OF FERRARA   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANTICLASTIC BENDING; BENT CRYSTALS; CRYSTALLINE SILICONS; HIGH RESOLUTION X RAY DIFFRACTION; MECHANICAL ANISOTROPY; MOSAIC CRYSTALS; SILICON CRYSTAL;

ANISOTROPY; CHARGED PARTICLES; PARTICLE BEAM DYNAMICS; PARTICLE BEAMS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

BENDING (DEFORMATION);

EID: 70249148664     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/18/182005     Document Type: Article

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