High-resolution TEM analysis of perpendicular CoCrPt-SiO2 media

IEEE Transactions on Magnetics

Volumn 44, Issue 11 PART 2, 2008, Pages 3496-3498

  Araki, Ryoko ^a   Takahashi, Yoshio ^a   Takekuma, Ikuko ^a   Narishige, Shinji ^a  

^a HITACHI LTD   (Japan)

Author keywords

CoCrPt SiO2; Electron microscopy; Microstructure; Perpendicular magnetic recording

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PLATINUM COMPOUNDS; SILICA; SILICON; TEXTURES;

AVERAGE GRAIN SIZE; COCRPT-SIO2; CRYSTALLOGRAPHIC ORIENTATIONS; GRAIN BOUNDARY WIDTHS; HIGH-RESOLUTION TEM ANALYSIS; INTER-GRANULAR EXCHANGE COUPLINGS; PERPENDICULAR MAGNETIC RECORDING; PERPENDICULAR MEDIA;

CHROMIUM COMPOUNDS;

EID: 70249138831     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2002415     Document Type: Article

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