Mapping of elemental composition in air-oxidized Ti3SiC2

Journal of the Australian Ceramic Society

Volumn 44, Issue 2, 2008, Pages 52-55

  Pang, Wei Kong ^a   Low, I M ^a   Prince, K E ^b   Atanacio, A J ^b  

^a CURTIN UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Depth profile; Oxidation; Rutile; SIMS; Ti3SiC2

Indexed keywords

DEPTH PROFILE; DUPLEX MICROSTRUCTURES; ELEMENTAL COMPOSITIONS; GRADED LAYERS; NEAR-SURFACE; OXIDE SCALE; RUTILE; SIMS; TI3SIC2; TIO; UNIFORM LAYER;

DEPTH PROFILING; OXIDATION; OXIDE MINERALS; SCALE (DEPOSITS); SECONDARY ION MASS SPECTROMETRY; TITANIUM OXIDES;

SILICON CARBIDE;

EID: 70149118108     PISSN: 0004881X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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