Simultaneous microscopic measurements of photodarkening and photoexpansion in chalcogenide films

Journal of Physics D: Applied Physics

Volumn 42, Issue 13, 2009, Pages

  Yang, Zhiyong ^a   Anheier Jr , Norman C ^b   Qiao, Hong A ^b   Lucas, Pierre ^a  

^a University of Arizona   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED FILMS; BAND GAPS; CHALCOGENIDE FILMS; DIFFERENT THERMAL HISTORY; GRATING EFFICIENCY; GRATING FABRICATION; HOMOPOLAR BONDS; LOCAL SCALE; LONG TERM STABILITY; MICROSCOPIC ANALYSIS; MICROSCOPIC MEASUREMENT; NEAR-FIELD SCANNING; PHOTODARKENING; PHOTOEXPANSION; STRUCTURAL ORIGIN; TOPOGRAPHY IMAGES; VOLUME CHANGE;

THERMAL EXPANSION;

EID: 70149092489     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/13/135412     Document Type: Article

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