Defect engineering of titanium dioxide

Journal of the Australian Ceramic Society

Volumn 44, Issue 2, 2008, Pages 63-67

  Bak, T ^a   Nowotny, J ^a   Nowotny, M K ^a   Sheppard, L R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING RATES; DEFECT DISORDER; DEFECT ENGINEERING; EFFECT OF OXYGEN; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; ELEVATED TEMPERATURE; EXPERIMENTAL DATA; IN-SITU; OXIDATION AND REDUCTION; OXIDE SEMICONDUCTOR; OXYGEN ACTIVITY; PROCESSING CONDITION;

COOLING; DEFECTS; ELECTRIC CONDUCTIVITY; MONITORING; NIOBIUM; OXYGEN; TITANIUM; TITANIUM DIOXIDE;

IN SITU PROCESSING;

EID: 70149088529     PISSN: 0004881X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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