New detector architecture, for electron microscopes with SDDs

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 204-205

  Soltau, H ^a   Jaratschin, O ^b   Liebel, A ^b   Niculae, A ^a   Simsek, A ^b   Eckhard, R ^a   Hermenau, K ^a   Lechner, P ^a   Lutz, G ^a   Schaller, G ^c   Schopper, F ^c   Strder L ^c  

^a PNSENSOR GMBH   (Germany)

^b PNDETECTOR GMBH   (Germany)

^c MPI HALBLEITERLABOR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70049100072     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094033     Document Type: Article

References (3)

1. H.Soltau et al, Microscopy and Microanalysis 14, 1156 (2008).
2. L. Str"der et al, Microscopy and Microanalysis 14, 76 (2008).
3. T. Armbrust, FZ Karlsruhe, Master Thesis, IKP, 2004.