Direct observation of conducting paths in tio2 thin film by transmission electron microscopy

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 996-997

  Kwon, D H ^a   Jeon, J M ^a   Jang, J H ^a   Kim, K M ^a,b   Hwang, C S ^a,b   Kim, M ^a  

^a Seoul National University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949189527     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093209     Document Type: Article

References (3)

1. H. Schroeder et al., Micro. Engineering 84 (2007) 1982
2. R. L. Clarke et al., Am. Lab. 20 (1988) 6
3. L.A. Bursill et al., Prog. Solid State Chem. 7, (1972) 177.