Quantitative characterisation of surface defects and composition on PtRu nanoparticles using aberration-corrected TEM/STEM

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 1416-1417

  Chang, L Y ^a,b   Lazar, S ^a,c   Baranova, E A ^d   Bock, C ^d   Botton, G A ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b MONASH UNIVERSITY   (Australia)

^c Thermo Fisher Scientific   (United States)

^d NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949182932     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094744     Document Type: Article

References (6)

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4. L. Gontard-Cervera et al., Angewandte Chemie Int. Ed. 46 (2007) 3683.
5. G. Lovely et al., Appl. Phys. Lett. 88 (2006) 093124.
6. J. M. Cowley and A. F. M. Moodie, Acta. Crystallogr. 10 (1957) 609.