Three-dimensional visualization and characterization of morphology and internal microstructural features of primary silicon crystals in a cast Al-Si base alloy

Journal of Crystal Growth

Volumn 311, Issue 19, 2009, Pages 4454-4461

  Singh, H ^a   Gokhale, A M ^a   Mao, Y ^a   Tewari, A ^b   Sachdev, A K ^b  

^a Georgia Institute of Technology   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

Author keywords

A1. Crystal morphology; A1. Optical microscopy; A1. Solidification; A2. Bulk crystal growth; A2. Growth from melt; B1. Metals

Indexed keywords

A1. CRYSTAL MORPHOLOGY; A1. OPTICAL MICROSCOPY; A1. SOLIDIFICATION; A2. BULK CRYSTAL GROWTH; A2. GROWTH FROM MELT; B1. METALS;

ALUMINUM; CERIUM ALLOYS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; DIGITAL IMAGE STORAGE; DISSOLUTION; EUTECTICS; GRAIN BOUNDARIES; IMAGE PROCESSING; IMAGE RECONSTRUCTION; METAL MELTING; METAL RECOVERY; MICROCRYSTALLINE SILICON; MICROSTRUCTURAL EVOLUTION; MORPHOLOGY; OPTICAL DATA PROCESSING; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; SILICON; SMELTING; SOLIDIFICATION; THREE DIMENSIONAL;

SILICON ALLOYS;

EID: 69949173671     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.08.001     Document Type: Article

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